Citation: Y. Zheng, X. Zhang, S. Wang, Q. Li, H. Qin*, and B. Li*, “Similarity Evaluation of Topography Measurement Results by Different Optical Metrology Technologies for Additive Manufactured Parts”, Optics and Lasers in Engineering 126 (2020): 105920. https://doi.org/10.1016/j.optlaseng.2019.105920
Authors: Yi Zheng [Iowa State University, Ames, IA (United States)], Xiao Zhang [Iowa State University, Ames, IA (United States)], Shaodong Wang [Iowa State University, Ames, IA (United States)], Qing Li [Iowa State University, Ames, IA (United States)], Hantang Qin [Iowa State University, Ames, IA (United States)], Beiwen Li [Iowa State University, Ames, IA (United States)]
Publication Info: Optics and Lasers in Engineering 126 (2020) 105920
DOI: 10.1016/j.optlaseng.2019.105920